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ENGINEERING 232 - Engineering of Materials

Go to Semester: Spring 2001, Spring 2002, Spring 2003, Spring 2004, Spring 2006

Analytical electron microscopes are used in the microcharacterization of materials. The scanning electron microscope (SEM) makes possible the study of the fine structure of surfaces, while X-ray analysis yields data about a material's elemental composition. The use of both techniques enables the acquisition of different but complementary data from the same material.

MICROCHARACTERIZATION LAB I: TEM imaging of materials.
MICROCHARACTERIZATION LAB II: TEM imaging of materials. Click on the picture to see TEM images of three crystalline materials: crocidolite asbestos, molybdenum trioxide crystals, and aluminum gallium nitride (AlGaN) nanowires.

 
MICROCHARACTERIZATION LAB II: X-ray energy dispersive spectroscopy (EDS).
Click on the picture to see EDS spectra from crocidolite asbestos, molybdenum trioxide, and aluminum gallium nitride nanowires, showing their elemental composition.