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Crocidolite Asbestos
Below, L to R: TEM brightfield imaging and two micrographs of TEM darkfield imaging, capturing two different angles from the same fiber as in the brightfield image. This demonstrates the crystalline nature of the material.


Below, L: TEM lattice imaging, showing atomic planes with 0.45nm spacing;
Below, R: TEM diffraction imaging, which enables determination of atomic plane spacing in the crystal.

Below: X-ray EDS spectrum, showing Si, Fe, Mg, Na, lines