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ENGINEERING 232 - Engineering of Materials
Go to Semester: Spring 2001, Spring 2002, Spring 2003, Spring 2004, Spring 2006
Analytical electron microscopes are used to teach principles of high-precision engineering design and microcharacterization of materials.
Scanning electron microscopy (SEM) of materials.
Below are SEM micrographs of the broken ends of metal slugs of various
compositions. The slugs were prepared during a lab session demonstrating mechanical properties of
materials using the Instron to stretch the slugs to their breaking point. The SEM reveals
that the materials have different microstructure that, in part, accounts for their
different behavior under strain.
Brass (below left), Steel (below right)
Copper (below left), Aluminum (below right)
Transmission electron microscopy (TEM) and X-ray
energy dispersive spectroscopy (EDS).
This is an x-ray EDS spectrum from a 200um latex sphere coated with gold, as visualized in the
transmission electron microscope, that demonstrates the presence of gold (Au)
and copper (Cu). The copper signal arises from backscattered electrons striking
the support grid. The background continuum displays the typical contribution from
Brehmstrahlung (braking radiation) x-rays. The x-axis displays x-ray
energies; the y-axis displays the number of counts per channel.
