ENGINEERING 232 - Engineering of Materials
Go to Semester: Spring 2001, Spring 2002, Spring 2003, Spring 2004, Spring 2006
Analytical electron microscopes are used to teach principles of
high-precision engineering design and microcharacterization of materials.
Scanning electron microscopy (SEM) of materials.
Below are SEM micrographs of the broken ends of a brass (left) and a copper (right)
slug. The slugs were prepared from a lab session demonstrating mechanical properties of
materials using the Instron to stretch the slugs to the breaking point. The SEM reveals
that the two materials have different microstructure that, in part, accounts for their
different behavior under strain.
Interpretation of data from scanning electron
Below are two SEM micrographs of the same integrated circuit (IC) that demonstrate
the importance of understanding the instrument's operating parameters. The micrograph on
the left was captured using a 5KV electron beam; on the right, a 15KV beam. The surface of
the material exhibits different characteristics depending on the energy of the incoming
radiation used to display them. These differences may be quantitated to yield meaningful
data about the IC components.
Transmission electron microscopy (TEM) and X-ray
energy dispersive spectroscopy (EDS).
This an EDS spectrum from a 500um region of stainless steel, as visualized in the
transmission electron microscope, that demonstrates the presence of iron (Fe), nickel
(Ni), and chromium (Cr).